Powering Quality with TrakSYS Smart Devices

In this webinar, Nic Azad moderates a discussion with Dave Ray, and Penuel Chow, Applications Engineer at Parsec, exploring how TrakSYS® Smart Devices empower manufacturers to digitize and strengthen their quality operations.

As organizations continue their digital transformation journeys, many face challenges with data accessibility, outdated infrastructure, and disconnected systems. Parsec’s TrakSYS Smart Devices provide a cost-effective, IIoT-driven solution to these challenges—helping manufacturers capture and act on real-time data without major infrastructure changes.

Through live demonstrations, the team showcases how Smart Devices collect and process telemetry data (vibration, temperature, pressure, counts) and feed it directly into TrakSYS Quality Management for SPC (Statistical Process Control), alerts, and automated workflows. The session also covers how these devices form mesh networks, enabling scalable, low-configuration deployments.

Key topics covered include:

• Overcoming infrastructure barriers in digital transformation
• Using IIoT Smart Devices for real-time data acquisition and analysis
• Automating SPC and quality workflows in TrakSYS
• Enabling proactive quality management through real-time alerts and rules
• How mesh networking and edge computing simplify deployment and scalability
• Integrating Smart Device data into the TrakSYS MOM platform for contextualized insights

Together, the TrakSYS platform and Smart Devices create a unified ecosystem for monitoring, measuring, and managing quality—driving continuous improvement and operational excellence.